Methods of Surface Analysis
Part 1: Spectroscopic and Diffraction methods: X-ray Photoelectron Spectroscopy, Auger Electron Spectroscopy, Secondary Ion Mass Spectroscopy, Low Energy Electron Spectroscopy, Reflection High Energy Electron Spectroscopy
Part 2: Microprobe techniques: Scanning Tunneling Microscopy, Atomic Force Microscopy
Practical works: Solving a material problem with surface analysis
- Professor: Anna Neus Igual Muñoz
- Professor: Igor Stolichnov
- Teacher: Felix Risch