This course covers the analysis and implementation of test techniques for digital and mixed-mode VLSI. Regular class lectures form the core of the course.
Introduction to test theory
Introductory topics cover the role of testing, automatic test equipment and a brief overview of the economics of test.
Test methods
In a second part, fault modeling and test methods are studied. The major topics that will be considered are related to fault simulation, automatic test-pattern generation (significant combinational and sequential ATPG algorithms), measures of testability and miscellaneous test methods. Industry popular models and algorithms are presented and exercised.
Design for testability
A third part sets the focus on design for test (DFT) techniques. Tackled topics include scan design, built-in-self-testing (BIST – LFSR and signatures) and the Boundary-Scan standard (JTAG).
Aside from theoretical lectures, a number of course modules are devoted to in-class guided exercise sessions, and hand-on computer laboratory sessions, which take place along the semester and complement with practical oriented presentation of the topics.
- Professor: Alexandre Schmid
