This course covers the fundamentals of bioelectronics and integrated microelectronics for biomedical and implantable system applications. Specific issues and trade-offs that appear at the circuit and systems levels of invasive microelectronic systems as well as their possible eluding designs, methods and classical implementations are discussed. Hardware for neuromorphic systems is presented. Several case studies are presented.
This course covers the analysis and implementation of test techniques for digital and mixed-mode VLSI. Regular class lectures form the core of the course.
Introduction to test theory
Introductory topics cover the role of testing, automatic test equipment and a brief overview of the economics of test.
In a second part, fault modeling and test methods are studied. The major topics that will be considered are related to fault simulation, automatic test-pattern generation (significant combinational and sequential ATPG algorithms), measures of testability and miscellaneous test methods. Industry popular models and algorithms are presented and exercised.
Design for testability
A third part sets the focus on design for test (DFT) techniques. Tackled topics include scan design, built-in-self-testing (BIST – LFSR and signatures) and the Boundary-Scan standard (JTAG).
Aside from theoretical lectures, a number of course modules are devoted to in-class guided exercise sessions, and hand-on computer laboratory sessions, which take place along the semester and complement with practical oriented presentation of the topics.
- Teacher: Alexandre Schmid
- Teaching Assistants: Abdulkadir Akin, Selman Ergunay, Mustafa Kilic, Jonathan Narinx, Jury Sandrini